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¡à Hardware Design
   - DRAM(DDR/Mobile/Graphic), Flash memory(Nor/Nand), PRAM,

     Analog & Digital Circuit
   - Memory Card Controller : RTL Coding, Synthesis, Static Timing Analysis,
     AMBA-based bus protocol & ARM-based SoC chip design, DFT Implementation
     SATA, SAS, PCIe, USB2.0/3.0, SD/MMC interface,
     ARM-based embedded SW development & HW validation,
     System Verilog Verification, FPGA Implementation & Verification,
     Signal Processing Algorithm Development for Memory & Storage System,
     Channel Codes(Error Detection/Correction Codes) Design & HW/FW IP Design


¡à Software Design
   System SW, Computer Architecture, Memory & Storage Algorithm Design,
   FTL, Flash Memory File System, Journaling File System Design,
   Virtual Memory Management, Cache Algorithm,

   Dynamic Memory Management Development,
   Application Processor, Multimedia Processor, Memory Card Controller F/W,
   Inter-Processor Communication Algorithm Design,
   Parallel Processing Algorithm for SMP/AMP multi-Processor,
   HW & SW Performance Trade-off, SW Engineering,
   Embedded System Test, Test Case Design, Dependability, Fault Tolerant System Test
   Embedded System Development Process, Performance Analysis, OS, I/O System,

   Storage System, Infra(Clear Case, Clear Quest, Test Automation Tool)


¡à Device Process
   Oxidation, Photo Resist, Photolithography, Etch, Diffusion, Cleaning, Thin Film,
   Ion Impantation, CVD, Metallization, Device Isolation, Transistor, Capacitor,
   Dielectric, SiO2/SiON Gate Dielectrics, High-K/Metal Gate, Device Analysis
 

¡à Manufacturing Technology
   - Yield Enhancement: Defect Reduction, Contamination Evaluation Technology,
     Particle Detection, Gas Impurity Evaluation Technology, Surface/Chemical
     Analysis Technology, Contamination Technology
   - Metrology:Pattern Process Inspection, Critical Dimension Measurement
 

¡à Quality & Reliability Engineering for Semiconductor
   Accelerated Life/Degradation Test Modeling & Analysis,
   System/Software Reliability & Warranty Engineering,
   Virtual Metrology & APC (Advanced Process Control) Modeling,
   Multi-Stage SPC (Statistical Process Control) and/or DOE (Design of Experiment),
   Multivariate Modeling & Analysis (include Data Mining Methodology),
   Sampling & Measurement Risk Modeling under Automated Dispatching System  


¡à Reliability Technology for Semiconductor
   Device Reliability(DRAM, Flash), Advanced Gate Stack Reliability,
   Novel Device Reliability(PCM, MRAM, etc),

   Device Characterization and Reliability Modeling,
   Design-In Reliability, Interconnect Reliability, Electro-migration, Stress-migration,
   BTS (Bias Temperature Stress), 3D interconnect, Thin Film Stress analysis,
   Novel Materials for Interconnects Circuit Reliability,

   Failure Analysis & Life Time Projection
   Package level reliability, Solder joint reliability, Board level reliability

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¡à Dearsamsung.co.kr -> °æ·Âä¿ë -> ¹ÝµµÃ¼»ç¾÷ºÎ ¸Þ¸ð¸®´ã´ç °æ·Â»ç¿ø ¹× ¹Ú»ç±Þ¿¬±¸¿ø

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¡à Á¢¼ö±â°£ : '10. 11.27 (Åä) ~ 12. 12 (ÀÏ)

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¡à  ¹® ÀÇ Ã³ : ¸Þ¸ð¸®´ã´ç Ã¤¿ë´ã´çÀÚ (031-208-6065, applymemory@samsung.com)



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