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Advanced Logic Process Development & Integration |
- SiO2/SiON Gate Dielectrics - High-K/Metal Gate - Etch - Thin Film - Silicide - Ultra Shallow Junction    (including RTA & LSA) - Cu/Ultra Low-K - Strain Engineering - Lithography(including OPC/RET) - FEOL/BEOL Process Integration |
- foundry, logic, image    sensor¿Í power device    business processes¿¡    ´ëÇÑ ÀÌÇØµµ, Áö½Ä º¸À¯ÀÚ - ¹ÝµµÃ¼ ºÐ¾ß¿¡ ´ëÇÑ    Àü¹ÝÀûÀÎ ¹è°æ Áö½Ä°ú °æÇè º¸À¯ÀÚ |
Device & Reliability Engineering |
- Device & Reliability Engineering - Device Physics and Optimization - SRAM Development - Device Reliability    (including BEOL reliability) - Strain/SPICE Modeling & Simulation |
Design Infra Development |
- DFM Engineering - Design Rule Generation - Design Infra System |
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- Defect & Yield Engineering - CMOS Image Sensor Development,    Integration, Device & Analysis - Power Device Process Development,    Integration, Device & Analysis |
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Photo |
- Litho process engineer - Litho equipment engineer for scanner - Litho equipment engineer for spinner |
- defect reduction °³¼± - foundry customerÇù¾÷ - photo resist    ¶Ç´Â applicable materials °æÇè |
Etch |
- Logic/Foundry Etch Process engineer - 300mm FAB Dry Etch Process engineer - Defect/Yield management engineer - Dry Etch Process department manager |
- 3³â ÀÌ»óÀÇ 300m ¹ÝµµÃ¼    Fab process °æÇèÀÚ - dry etch process °æÇèÀÚ    (STI, Gate, Spacer, MC,    Single/Dual Damascene) - Fab process ±â¼ú º¸À¯ÀÚ |
Metal |
- Metal equipment engineer - Metal process engineer |
- ÃÖ¼Ò 2³â ÀÌ»óÀÇ FAB    equipment/process    engineer °æÇèÀÚ |
CVD |
- CVD equipment engineer - CVDl process engineer - Defect improvement - Foundry FAB operation, system expert |
- ÃÖ¼Ò 2³â ÀÌ»óÀÇ FAB    equipment/process    engineer °æÇèÀÚ |
Diffusion Cleaning Implantation |
- Metal equipment engineer - Metal process engineer |
- Quality tool¿¡ ´ëÇÑ ÀÌÇØµµ - FMEAs - 6 Sigma - SPC implementation |
CMP |
- New Device CMP Process Development    engineer - CMP defects engineering analysis - New CMP slurries and post CMP    cleaning solutions developer - New CMP consumables    (Pad,conditioning  disk µî) developer - Foundry business customer    correspondence for CMP processes |
- CMP process Àü¹®°¡ - Pattern Density Effect    on CMP ´ëÇÑ Áö½Ä º¸À¯ÀÚ - Slurry/Cleaning    Chemical Formulation    ´ëÇÑ ÀÌÇØ ù± - 8 Module Process¿¡ ´ëÇÑ    ÀÌÇØ ù± |
PIE |
- Yield improvement & qualification of    new process technology - Electrical data distribution    improvement & ensure sufficient    margin to prevent scraps - Identifying line excursion & root cause    analysis |
- FEOL/BEOL °æÇèÀÚ - ¹ÝµµÃ¼ processing/    device physic ´ëÇÑ ÀÌÇØ ù± |
Defect analysis |
- Defect Monitoring System & Control    specialist - Defect Analysis & Reduction specialist |
- ¹ÝµµÃ¼ °ü·Ã ¾÷°è Á¾»çÀÚ - ¹ÝµµÃ¼Chip Maker °æÇèÀÚ - °Ë»ç ¼³ºñTool Maker Ãâ½Å - OCD °èÃø¼³ºñ Tool Maker Ãâ½Å - Defect data ºÐ¼®°¡´ÉÀÚ |
Failure analysis |
- SRAM & Logic Test specialist - Device level analysis specialist - Physical Failure Analysis Tool(STEM,    SEM, FIBµî)À» Ȱ¿ëÇÑ ºÐ¼® |
- ¹ÝµµÃ¼ °ü·Ã ¾÷°è Á¾»çÀÚ - Logic Chip ºÐ¼® °æÇèÀÚ - ºÐ¼® Tool(TEM, SEM, FIB)    °æÇèÀÚ - Logic/SRAM Test °æÇèÀÚ - ¼ÒÀÚLevel Ư¼ºÆò°¡ °æÇèÀÚ |